Dielectric barrier discharge coupled with oxygen-vacancy-rich NiO-CeO<sub>2</sub> for efficient and low-energy degradation of SF<sub>6</sub>

Runze Dong, Wenhao Li, Qiyu Yang, Ping Li, Pan Zhang, Lemeng Wang, Dong Fu

Chinese Journal of Chemical Engineering . 2025, (6): 256 -269 . DOI: 10.1016/j.cjche.2024.12.022