A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage

›› 2008, Vol. 16 ›› Issue (1): 52-56.

A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage

王杭州¹, 陈丙珍¹, 何小荣¹, 邱彤¹, 章龙江²

1. Department of Chemical Engineering, Tsinghua University, Beijing 100084, China;
2. Chemicals & Marketing Company, Petro China Company Limited, Beijing 100011, China

收稿日期:2007-05-23 修回日期:2007-10-27 出版日期:2008-02-28 发布日期:2008-02-28
通讯作者: CHEN Bingzhen, E-mail: dcecbz@tsinghua.edu.cn

A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage

WANG Hangzhou¹, CHEN Bingzhen¹, HE Xiaorong¹, QIU Tong¹, ZHANG Longjiang²

1. Department of Chemical Engineering, Tsinghua University, Beijing 100084, China;
2. Chemicals & Marketing Company, Petro China Company Limited, Beijing 100011, China

Received:2007-05-23 Revised:2007-10-27 Online:2008-02-28 Published:2008-02-28

摘要/Abstract

摘要： Digraph-based causal models have been widely used to model the cause and effect behavior of processsystems. Signed digraphs (SDG) capture the direction of the effect. It should be mentioned that there are loops in SDG generated from chemical process. From the point of the inherent operability, the worst unsafe factor is the SDG having positive loops that means any disturbance occurring within the loop will propagate through the nodesone by one and are amplified gradually, so the system may lose control, which may lead to an accident. So findingthe positive loops in a SDG and treating these unsafe factors in a proper manner can improve the inherent safety of a chemical process. This article proposed a method that can detect the above-mentioned unsafe factors in the process conceptual design stage automatically through the analysis of the SDG generated from the chemical process. Acase study is illustrated to show the working of the algorithm, and then a complicated case from industry is studiedto depict the effectiveness of the proposed algorithm.

关键词: signed digraphs, inherent safety, conceptual design

Abstract: Digraph-based causal models have been widely used to model the cause and effect behavior of processsystems. Signed digraphs (SDG) capture the direction of the effect. It should be mentioned that there are loops in SDG generated from chemical process. From the point of the inherent operability, the worst unsafe factor is the SDG having positive loops that means any disturbance occurring within the loop will propagate through the nodesone by one and are amplified gradually, so the system may lose control, which may lead to an accident. So findingthe positive loops in a SDG and treating these unsafe factors in a proper manner can improve the inherent safety of a chemical process. This article proposed a method that can detect the above-mentioned unsafe factors in the process conceptual design stage automatically through the analysis of the SDG generated from the chemical process. Acase study is illustrated to show the working of the algorithm, and then a complicated case from industry is studiedto depict the effectiveness of the proposed algorithm.

Key words: signed digraphs, inherent safety, conceptual design

王杭州, 陈丙珍, 何小荣, 邱彤, 章龙江. A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage[J]. , 2008, 16(1): 52-56.

WANG Hangzhou, CHEN Bingzhen, HE Xiaorong, QIU Tong, ZHANG Longjiang. A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage[J]. , 2008, 16(1): 52-56.

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A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage

A Signed Digraphs Based Method for Detecting Inherently Unsafe Factors of Chemical Process at Conceptual Design Stage

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